Perovskite/Crystalline Silicon Tandem Module EL Tester
Simultaneous EL testing for perovskite and crystalline silicon layers, providing independent results.
Perovskite/Crystalline Silicon Tandem Module 2DPL Tester
Simultaneous 2DPL testing for perovskite and crystalline silicon layers, delivering independent results.
Line-Scan EL Visual Tester (F4-EVR)
Replaces traditional area-array EL imaging with line-scanning, integrating AI defect detection directly into production lines for cost-effective automation.
Junction Box Defect Tester (JB-AI)
AI-based detection of no soldering, misalignment, underfill, and diode misconnection in module junction boxes.
Module 2DPL Tester
First launched Module 2DPL Tester for OBB,lamination, and dispensing processes, utilizingmulti-laser elements and non-contact near-infraredimaging in China.
