AI/EL defect offline detection, compatible with Topcon, HJT, BC, full-size cell, and half-size cell applications.
Inline Cell EL Tester
AI/EL defect inline detection, suitable for Topcon, HJT, BC, full-size cell, and half-size cell applications.
Inline Cell 2DPL Tester
AI/2DPL inline detection for within cell bright/dark defects, designed for Topcon, HJT, BC, full-size cell, and half-size cell applications.
Inline Cell 1DPL Tester
AI/1DPL inline detection targeting Leco/airflow marks/ edge finger interruptions, applicable to Topcon, HJT, BC, full-size cell, and half-size cell applications.
Inline Cell 1D2DPL Tester
AI/1D2DPL inline detection for simultaneous monitoring of within cell bright/dark defects and Leco/airflow marks/edge finger interruptions, compatible with Topcon, HJT, BC, full-size cell, and half-size cell applications.
Offline Cell Hotspot Tester
Hotspot defect with AI offline detection, suitable for Topcon, HJT, BC, full-size cell, and half-size cell applications.
