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Photovoltaic Cell Inspection Applications
Photovoltaic Module Inspection Applications
Photovaltaic Cell Smart Factory Applictions
Photovoltaic Module Al factory Applications
  • Offline Cell EL Tester
    AI/EL defect offline detection, compatible with Topcon, HJT, BC, full-size cell, and half-size cell applications.
  • Inline Cell EL Tester
    AI/EL defect inline detection, suitable for Topcon, HJT, BC, full-size cell, and half-size cell applications.
  • Inline Cell 2DPL Tester
    AI/2DPL inline detection for within cell bright/dark defects, designed for Topcon, HJT, BC, full-size cell, and half-size cell applications.
  • Inline Cell 1DPL Tester
    AI/1DPL inline detection targeting Leco/airflow marks/ edge finger interruptions, applicable to Topcon, HJT, BC, full-size cell, and half-size cell applications.
  • Inline Cell 1D2DPL Tester
    AI/1D2DPL inline detection for simultaneous monitoring of within cell bright/dark defects and Leco/airflow marks/edge finger interruptions, compatible with Topcon, HJT, BC, full-size cell, and half-size cell applications.
  • Offline Cell Hotspot Tester
    Hotspot defect with AI offline detection, suitable for Topcon, HJT, BC, full-size cell, and half-size cell applications.
  • String- EL/Front-Rear side Visual Inspection Inline Tester (ILS-E2V3R1):
    Real-time, precise detection of micro cracks, soldering defects and etc; compatible withvisual inspection and Topcon, HJT, BC processes.
  • String PL Inline Tester (ILS-PL):
    First launched inline string PL detection technology, designed for 0BB lamination and dispensing processes in China. Overcomes EL power limitations and prevent defect misjudgement.
  • Offline String EL Tester (StringEL-OL)
    Offline string EL rework tester with dual operation table. With user-friendly interface and well stability.
  • Offline String EL Tester (StringEL-OL)
    First launched offline string PL rework tester, using non-contact detection to resolve 0BB, lamination, and dispensing process challenges like power difficulties in China.
  • Module EL Front-Rear Visual Tester (EVR-J12-AI)
    EL and visual inspections with AI for PV modules can accurately identify micro cracks, cell fragments, ribbon soldering defects and etc. to ensure quality, efficiency, and lifecycle reliability.
  • Line-Scan Front-Rear Visual Tester (BYD90-VR)
    Ultra-narrow line-scanning dual-side visual module inspection with customized lighting for high-definition imaging. AI identification defects.
  • EL Defect False Negative Monitoring System (EL QC-AI)
    An AI monitoring system for inline EL to prevent false negative defect leakage (suitable for Topcon, HJT, BC, full-size cell, and half-size cell applications.)
  • EL Defect Tracking System (EL Blocking-AI)
    An AI tracking system for EL that identifies the bin of false negative cell (designed for Topcon, HJT, BC, full-size cell, and half-size cell applications.)
  • AOI Defect False Negative Monitoring System (AOI QC-AI)
    An AI Monitoring system for AOI to prevent defect false negative leakage (suitable for Topcon, HJT, BC, full-size cell, and half-size cell applications.)
  • AOI Defect Bin Tracking System (AOI Blocking-AI)
    An AI tracking system for AOI that identifies the bin of false negative cell (designed for Topcon, HJT, BC, full-size cell, and half-size cell applications.)
  • 2DPL Defect False Negative Monitoring System (2DPL QC-AI)
    An AI monitoring system for inline 2DPL to prevent false negative defect leakage (suitable for Topcon, HJT, BC, full-size cell, and half-size cell applications.)
  • 2DPL Defect Bin Tracking System (2DPL Blocking-AI)
    An AI tracking system for 2DPL that identifies the bin of false negative cell (designed for Topcon, HJT, BC, full-size cell, and half-size cell applications.)
  • EL/PL/AOI Defect AI Sorting System (EL/PL/AOI PA-AI)
    An AI classification and analysis system that identifies the cause of solar cell defect and classifies it into different categories.（designed for Topcon, HJT, BC, full-size cell, and half-size cell applications.）
  • EL Defect B-to-A Sorting System (EL BS-AI)
    An AI sorting system that identifies the overkilled cells, which reducing labor costs while maintaining standards (compatible with Topcon, HJT, BC, full-cell, and half-cell applications.)
  • String/Module EL Defect Centralized Control System (CCS)
    An AI centralized control system for NG image review coming from multiple lines with manual rechecking to reduce labor costs and improve efficiency.
  • String EL Defect Tracking System (DTS)
    First launched AI rework system in China, minimizing defective string reevaluation and enabling real-time image retrieval by distinct barcode for precise repairs.
Advanced Processes
  • Photovoltaic Inspection Applications

    Perovskite/Crystalline Silicon Tandem Module EL Tester

    Perovskite/Crystalline Silicon Tandem Module 2DPL Tester

    Line-Scan EL Visual Tester (F4-EVR)

    Junction Box Defect Tester (JB-AI)

    Module 2DPL Tester

    Cell 1D1D2D PL Tester (112-PL)

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  • Photovoltaic Smart Factory Applications

    Inline 2DPL Bright/Dark Cell Sorting System

    IV Tester Stability Monitoring System

    EL Bright/Dark Cell Intelligent Analysis System (MEGA-AI)

    EL Defect Misjudgement Prevention Monitoring System (MEL-QCAI)

    Visual Defect Misjudgement Prevention Monitoring System (MVR-QCAI)

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  • Other Applications

    Ribbon Inspection

    Flat Tube Inspection

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Learn more
  • Photovoltaic Inspection Applications
  • Photovoltaic Smart Factory Applications
  • Other Applications
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Cell Division: Mr. Yeh 13761463299

Room 103, No. 3 Building,111 Zhiye Rd., Pudong Dist., Shanghai,201299

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